fig5
From: Residual stress mapping of additively manufactured Inconel 718 via synchrotron X-ray diffraction
Figure 5. Spatial distribution of diffraction angles 2θ (°) for the (111), (200), (220), and (311) crystallographic planes. The maps illustrate the raw angular shifts across the plate cross-section in the (A) LD and (B) TD directions, which directly correspond to variations in interplanar spacing d prior to strain calculation. LD: Loading direction; TD: transverse direction.
