fig4
From: Residual stress mapping of additively manufactured Inconel 718 via synchrotron X-ray diffraction
Figure 4. Raw X-ray diffraction data and peak fits obtained using Pearson VII, Gaussian, and Pseudo-Voigt profiles. (A) Composite diffraction images over the entire sample, (B) integrated diffraction profile over an azimuthal range of ±5°, (C) fitting results for (111) reflection with three types of peak functions, and zoomed-in detail of peak bottom fitting; (D) R2 performance comparison heatmaps showing percentage of cases where the “To compare” function outperforms the “Be compared” function.
