fig11
From: Residual stress mapping of additively manufactured Inconel 718 via synchrotron X-ray diffraction
Figure 11. Residual stress field for the (A) LD and (B) TD in an additively manufactured Ni-based alloy, measured via synchrotron X-ray diffraction. The left and right columns correspond to LD and TD, respectively. Each map corresponds to a different crystallographic plane (hkl), as indicated above each panel. Red indicates tensile stress and blue indicates compressive stress. LD: Loading direction; TD: transverse direction.
