fig5

Figure 5. EBSD analysis for AM (CoCrNi)₉₄(TiAl)₆ and UIT-(CoCrNi)₉₄(TiAl)₆ in XOY plane. (A and F) IPF; (B and G) PF; (C and H) Recrystallization microstructure distribution; (D and I) Grain boundary distribution, grain size distribution; (E and J) KAM, local misorientataion statistics. EBSD: Electron backscatter diffraction; AM: additive manufacturing; UIT: ultrasonic impact treatment; IPF: inverse polar figures PF: polar figures; KAM: Kernel Average Misorientation.