fig6
Figure 6. Endurance cycling characteristics of HZO capacitors. Endurance characteristics were evaluated for HZO capacitors with Mo and MoNx electrodes using bipolar rectangular pulses at 100 kHz. The evolution of (A-C) 2Pr and (D-F) 2Ec and imprint field [Eimp = (Ec+ + Ec-)/2] was monitored as a function of switching cycles. In (D-F), solid symbols represent 2Ec plotted on the left y-axis, whereas hollow symbols denote Eimp plotted on the right y-axis. The black arrowed circles in D-F highlight representative 2Ec (left-pointing arrows) and Eimp (right-pointing arrows) data to clarify their corresponding y-axes. The data were obtained under applied voltages of 2.4 V (A and D), 2.0 V (B and E), and 1.6 V (C and F); (G-I) Benchmark comparison of ferroelectric properties with other stoichiometrically controlled electrode systems, including TaNx[a], RuOx[b], and TiNx[c,d]. (G) Pristine-state 2Pr values and (H) percentage change in 2Pr after wake-up (Δ2Pr) plotted against relative stoichiometry. For this work, data were extracted from Figure 6A, where Δ2Pr is defined as [(2Pr, max - 2Pr, pristine)/2Pr, pristine] × 100%. Comparative data were obtained under electric fields of 2.5 MV∙cm-1 for TaNx and RuOx and 3.0 MV∙cm-1 for this work and TiNx. (I) Benchmark comparison of endurance cycles plotted against relative stoichiometry. Endurance data for this work and RuOx[b] were obtained under an electric field of 2.5 MV∙cm-1, whereas data for TiNx[c,d] were evaluated at 3.0 MV∙cm-1. References [a]-[d] correspond to references[48-51], respectively. HZO: Hf0.5Zr0.5O2.








