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fig8

From:  Measurement of silicon carbide epilayer thickness using physics-informed neural networks and hybrid intelligent systems
Measurement of silicon carbide epilayer thickness using physics-informed neural networks and hybrid intelligent systems

Figure 8. Comparison of prediction errors between AE-PINN and the physical model under different types and intensities of noise. AE-PINN: Attention-enhanced physics-informed neural network.

Intelligence & Robotics
ISSN 2770-3541 (Online)
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