fig5

Measurement of silicon carbide epilayer thickness using physics-informed neural networks and hybrid intelligent systems

Figure 5. Typical reflectance spectrum of a SiC epilayer sample measured over the wavenumber range of 400-4,000 cm-1. Interference peaks are annotated with their corresponding wavenumber positions. SiC: Silicon carbide.

Intelligence & Robotics
ISSN 2770-3541 (Online)

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