Special Topic

Topic: Correlative Characterization and Multiscale Understanding of Dynamic Microstructure Evolution in Materials

A Special Topic of Microstructures

ISSN 2770-2995 (Online)

Submission deadline: 15 Feb 2027

Guest Editors

Prof. Hyoung Seop Kim
Graduate Institute of Ferrous and Eco Materials Technology, Pohang University of Science and Technology, Pohang, Gyeongsangbuk-do, South Korea.
Prof. Jae Bok Seol
Graduate Institute of Ferrous and Eco Materials Technology, Pohang University of Science and Technology, Pohang, Gyeongsangbuk-do, South Korea.

Special Topic Introduction

Advanced structural and functional materials undergo complex, dynamic microstructural changes during processing, deformation, thermal exposure, and phase transformations. Understanding these dynamic microstructural evolution mechanisms at multiple length and time scales is essential for tailoring material properties and designing next-generation advanced alloys and functional devices.

 

Recent breakthroughs in advanced in situ characterization techniques—such as in situ electron microscopy (TEM/SEM), in situ nanoindentation, synchrotron X-ray diffraction, neutron scattering, accelerator-based facilities, electron backscatter diffraction (EBSD), atom probe tomography (APT), and Digital Image Correlation (DIC)—combined with multiscale modeling approaches, have provided unprecedented insights into real-time microstructural phenomena. These phenomena include dislocation dynamics, deformation twinning, phase transformations, recrystallization, dynamic recovery, and defect evolution.

 

This Special Issue aims to bring together cutting-edge research and review articles focusing on the latest advancements in in situ characterization and multiscale analysis of dynamic microstructural behavior. We welcome high-quality contributions covering advanced structural metals, high-entropy alloys, functional materials, semiconductor defects, and additive manufacturing.

Keywords

In situ characterization, dynamic microstructure evolution, multiscale analysis, electron microscopy, X-ray diffraction, phase transformations, deformation mechanisms, recrystallization, Digital Image Correlation, microstructure–property relationships

Submission Deadline

15 Feb 2027

Submission Information

For Author Instructions, please refer to https://www.oaepublish.com/microstructures/author_instructions
For Online Submission, please login at https://www.oaecenter.com/login?JournalId=microstructures&IssueId=microstructures26081910582
Submission Deadline: 15 Feb 2027
Contacts: Juno, Assistant Editor, Mic@microstructj.net

Published Articles

Coming soon
Microstructures
ISSN 2770-2995 (Online)

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Portico

All published articles are preserved here permanently:

https://www.portico.org/publishers/oae/